Self-Test of a Physical Unclonable Function

The invention relates to a circuit unit (1) comprising a Physical Unclonable Function (6), hereinafter referred to as PUF (6), a verification unit (5) and an information storage device (7) for storing at least one Challenge-Response-Pair (CR1); wherein the Challenge-Response-Pair (CR1) comprises a Challenge Information (C1) and a Response Information (R1) associated therewith, and wherein the verification unit (5) is embodied and/or adapted, in order to bring about an input of the challenge information (C1) into the PUF (6) and to use a PUF Response (PR1) created thereafter by the PUF (6) and the Response Information for a comparison, and in dependence of the result of the comparison release or restrict a use of the PUF (6).

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