Speeding up high-throughput characterization of materials libraries by active learning: autonomous electrical resistance measurements
Literature Reference
Authors:
Felix Thelen, Lars Banko, Rico Zehl, Sabrina Baha, Alfred Ludwig
Year: 2023
An autonomous measurement algorithm was implemented in a resistance measurement device which scans materials libraries using active learning. By stopping once a sufficient accuracy is reached, an efficiency improvement of 70–90% can be achieved.
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