Speeding up high-throughput characterization of materials libraries by active learning: autonomous electrical resistance measurements
An autonomous measurement algorithm was implemented in a resistance measurement device which scans materials libraries using active learning. By stopping once a sufficient accuracy is reached, an efficiency improvement of 70–90% can be achieved.
- Source:
- Tags:
Backlinks
These are the other notes that link to this one.
Nothing links here, how did you reach this page then?
Comment
Share your thoughts on this note. Comments are not public, they are
messages sent directly to my inbox.
Aquiles Carattino
This note you are reading is part
of my digital garden. Follow the
links to learn more, and remember that these notes evolve over time. After all,
this website is not a
blog.